Characterization of X-ray Induced Damage in Alkanethiolate Monolayers by High-Resolution Photoelectron Spectroscopy

By K. Heister, M. Zharnikov, M. Grunze, L. Johansson, A. Ulman. 2001

208 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Renewable Energy, Sustainability and the Environment

View Paper: https://www.semanticscholar.org/paper/a1fd95368742a3fa472b137aa438d41d11607493