Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
By R. Cannara, M. Eglin, Robert W. Carpick. 2006
204 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering
View Paper: https://www.semanticscholar.org/paper/9fe1f119353b2b8dc503ecf392cb648ce11136d8
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In Atomic and Molecular Physics, and Optics
In Biomedical Engineering
Citations in the corpus
- Recent advances in single-asperity nanotribology (2008, background): “These techniques can be readily implemented, but they require additional time and care from the experimentalist [21, 55–62].”