Statistical monitoring of nonlinear product and process quality profiles
By James D. Williams, William H. Woodall, Jeffrey B. Birch. Quality and Reliability Engineering International, 2007
314 citations recorded by the source corpus.
Subfields: Management Science and Operations Research, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/9f1123e39303e447632ebdc4a8e38974afe64d57
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Management Science and Operations Research
- Mahmoud A. Mahmoud
- William H. Woodall
- Rassoul Noorossana
- J. P. Morgan
- Abolfazl Vaghefi
- Sam Davanloo Tajbakhsh
- Douglas M. Hawkins
- Changliang Zou
In Statistics and Probability
- Changliang Zou
- William H. Woodall
- Rassoul Noorossana
- Peihua Qiu
- Mahmoud A. Mahmoud
- Abolfazl Vaghefi
- Sam Davanloo Tajbakhsh
- J. P. Morgan
Citations in the corpus
- NONPARAMETRIC CONTROL CHART FOR MONITORING PROFILES USING CHANGE POINT FORMULATION AND ADAPTIVE SMOOTHING (2009, background): “statisticians. For instance, Williams, Woodall and Birch (2007) suggest three”
- Phase II Monitoring of Nonlinear Profiles (2009, methodology): “The estimated dose-response curve of a manufactured drug presented by Williams et al. (2007) can be considered as another example of nonlinear profile.”
- CONTROL CHART FOR MONITORING NONPARAMETRIC PROFILES WITH ARBITRARY DESIGN (2009, background): “In some applications, within-profile observations might be spatially or serially correlated, and between-profile observations might be auto-correlated (cf., Williams et al. 2007a,b, Zou et al. 2007a).”
- The monitoring of simple linear regression profiles with two observations per sample (2010, methodology): “[20] to monitor dose-response profiles used in high throughput screening.”
- Current research on profile monitoring (2007, methodology): “Their approach is contrasted with that of Williams, Woodall, and Birch (2007) using the same set of particleboard vertical density profi le data.”
- A CUSUM-based method for monitoring simple linear profiles (2009, unknown): “[18], and Jensen and Birch [4].”
- Profile Monitoring with Binary Data and Random Predictors (2011, unknown): “Nonlinear profile models were investigated by Williams et al. (2007).”