Physical Modeling of Temperature Coefficient of Resistance for Single- and Multi-Wall Carbon Nanotube Interconnects
By A. Naeemi, James D. Meindl. IEEE Electron Device Letters, 2007
171 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/9e81eccd387341093a258aa39e2c3ca810e54ea3
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Biomedical Engineering
- James D. Meindl
- A. Naeemi
- Kaustav Banerjee
- Hong Li
- Alessio Tamburrano
- M. Sarto
- H. Philip Wong
- Jie Deng
In Materials Chemistry
- James D. Meindl
- A. Naeemi
- Kaustav Banerjee
- Hong Li
- Wen-Yan Yin
- Navin Srivastava
- H. Philip Wong
- Chuan Xu
Citations in the corpus
- Performance Modeling for Single- and Multiwall Carbon Nanotubes as Signal and Power Interconnects in Gigascale Systems (2008, methodology): “The voltage-dependent resistance per unit length is [ 11 ]”