Atomic force microscope probe based controlled pushing for nanotribological characterization

By Metin Sitti. IEEE/ASME transactions on mechatronics, 2004

135 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/9df7be8fe24121373eb778405eb9b57c19eaffe3