Tensile testing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers
By Haibo Huang, F. Spaepen. 2000
589 citations recorded by the source corpus.
Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/9dcbc5a565108b6e2afc939aeafa744fd66b6121
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In Electronic, Optical and Magnetic Materials
- Subra Suresh
- L. Freund
- Sigurd Wagner
- Stéphanie P. Lacour
- Teng Li
- Nanshu Lu
- Joyelle Jones
- Zhigang Suo
In Materials Chemistry
- Nanshu Lu
- Zhigang Suo
- L. Freund
- P. Ferreira
- C. Carlton
- Sp P. Lacour
- Sigurd Wagner
- Stéphanie P. Lacour
In Mechanics of Materials
Citations in the corpus
- The effect of film thickness on the failure strain of polymer-supported metal films (2010, background): “04/09/2009 16:21:17 3 thickness ratios, the net elongation of the freestanding film upon rupture is small, typically less than a few percent [9-13].”
- Design and performance of thin metal film interconnects for skin-like electronic circuits (2004, background): “trically conducting much beyond the typical fracture strain of free-standing thin films of 1% to 2% [13], similar to stripes on nonprestretched PDMS substrates [4], [12].”
- What is behind the inverse Hall–Petch effect in nanocrystalline materials? (2007, background): “In the context of this discussion, it is valuable to consider the expected behavior of nanocrystalline copper, which has been widely investigated in the open literature [2,4,7,8,46,61–73], According to the model outlined above, copper would be more likely to exhibit an inverse Hall– Petch effect and”