Native oxidation of ultra high purity Cu bulk and thin films

By J. Iijima, Jaewon Lim, S. Hong, Shigeru Suzuki, K. Mimura, M. Isshiki. 2006

152 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/9dc5fc65bda934dc257850d1aed3eb7101ba4db4

How researchers see this paper

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In Electrical and Electronic Engineering

1. C. Gattinoni
2. A. Michaelides
3. A. Zettl
4. M. Crommie

In Electronic, Optical and Magnetic Materials

1. C. Gattinoni
2. A. Michaelides

In Materials Chemistry

1. C. Gattinoni
2. A. Michaelides
3. A. Zettl
4. M. Crommie

Citations in the corpus

• Atomistic details of oxide surfaces and surface oxidation: the example of copper and its oxides (2015, background): “3 nm CuO overlayer has been reported [4, 3, 317, 318, 319, 319].”
• Graphene as a long-term metal oxidation barrier: worse than nothing. (2013, background): “% to almost 100% Cu.”