A microelectromechanical load sensor for in situ electron and x-ray microscopy tensile testing of nanostructures

By Yong Zhu, N. Moldovan, Horacio Espinosa. 2005

133 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/9d965a4e000a9fd2a316d975632b8c5487e82629

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The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Horacio Espinosa
2. Yong Zhu
3. N. Moldovan
4. B. Peng

In Materials Chemistry

1. Horacio Espinosa
2. Yong Zhu
3. N. Moldovan
4. B. Peng
5. George C. Schatz
6. Pablo D. Zavattieri

Citations in the corpus

• Measurements of near-ultimate strength for multiwalled carbon nanotubes and irradiation-induced crosslinking improvements. (2008, methodology): “Tensile testing: approach and results The experimental work was carried out using an in situ transmission electron microscopy (TEM) method using a MEMS material testing syste”
• Design and Operation of a MEMS-Based Material Testing System for Nanomechanical Characterization (2007, methodology): “Through a proper calibration of the load sensor stiffness, the load can be computed, and a calibration equation is therefore identified [21].”