Photoluminescence imaging of silicon wafers

By T. Trupke, R. Bardos, M. Schubert, Wilhelm Warta. 2006

680 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/9d88be4ae558e2c12cad4c926df820cf25e0d6aa

Citations in the corpus

• On the detection of shunts in silicon solar cells by photo‐ and electroluminescence imaging (2008, neutral): “Electro- and photoluminescence (EL and PL) imaging have been introduced as very efficient techniques for spatially resolved characterization of silicon solar cells.(1,2) Specifically the localization of strong ohmic shunts in industrial multicrystalline (mc) silicon cells via EL and PL imaging has r”