Effects of ambient atmosphere on the transfer characteristics and gate-bias stress stability of amorphous indium-gallium-zinc oxide thin-film transistors

By S. Sung, J. Choi, Un-Bin Han, Kitae Lee, Joon-Hyung Lee, Jeong-Joo Kim, W. Lim, S. Pearton, D. Norton, Y. Heo. 2010

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