Principles of electronic materials and devices
By S. Kasap. 2000
549 citations recorded by the source corpus.
View Paper: https://www.semanticscholar.org/paper/9d45e834d1cb8b2225ace6d0c7fe1988775f3ecf
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- Geon‐Tae Hwang
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- Jungho Ryu
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- D. Jeong
Citations in the corpus
- High‐Performance Dielectric Ceramic Films for Energy Storage Capacitors: Progress and Outlook (2018, background): “Various mechanisms are considered responsible for the dielectric failure of capacitors, including intrinsic electric strength, thermal runaway, partial discharge, and electrostatic compressive forces.[8,17,28,29] Intrinsic electric breakdown is a material characteristic and is electronic in nature.”