Preparation of transmission electron microscopy cross-section specimens using focused ion beam milling

By R. Langford, A. Petford-Long. 2001

254 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Structural Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/9cae391462af07115e9660544fd8ac3781051420