High resolution electron microscopy
By S. Iijima. 2008
191 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Materials Chemistry, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/9bc761e5bcbaaacbf30573a0f881a1528afd094a
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Biomedical Engineering
- K. Novoselov
- A.K. Geim
- M. Katsnelson
- Richard L. Sandberg
- G. Algara-Siller
- Jianwei Miao
- Changyong Song
- U. Kaiser
In Materials Chemistry
In Surfaces, Coatings and Films
- Richard L. Sandberg
- G. Algara-Siller
- Jianwei Miao
- Changyong Song
- U. Kaiser
- Jannik C. Meyer
- A. Chuvilin
Citations in the corpus
- On the roughness of single- and bi-layer graphene membranes (2007, background): “While the total (integrated) intensities within each Bragg reflection agree quite well with the model of a flat membrane, the actual shape and widths of the peaks show striking deviations from the standard diffraction behaviour of 3D crystals [20,21].”
- Coherent X-Ray Diffraction Imaging (2012, methodology): “Compared to scanning probe microscopy [5] and electron microscopy [4], CDI can be applied to image thick objects at high resolution in 3-D.”
- From graphene constrictions to single carbon chains (2009, methodology): “The spherical aberration is set to 20 μm and imaging is done under Scherzer conditions [16].”