Chemical and electronic characterization of methyl-terminated Si(111) surfaces by high-resolution synchrotron photoelectron spectroscopy

By R. Hunger, R. Fritsche, B. Jaeckel, W. Jaegermann, Lauren J. Webb, Nathan S. Lewis. 2005

143 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/9b85eea2c60ced81ed7e20057516918ad7c738db