Single-qubit-gate error below 10 -4 in a trapped ion

By K. Brown, A. C. Wilson, Y. Colombe, C. Ospelkaus, A. M. Meier, Emanuel Knill, Dietrich Leibfried, David J. Wineland. 2011

193 citations recorded by the source corpus.

With a {sup 9}Be{sup +} trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2)x10{sup -5}, below the threshold estimate of 10{sup -4} commonly considered sufficient for fault-tolerant quantum computing. The {sup 9}Be{sup +} ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

Subfields: Artificial Intelligence, Atomic and Molecular Physics, and Optics

View Paper: https://www.semanticscholar.org/paper/9a9a8952b3c22bc7e7950d2ed65f0bb44b79a9e2

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In Artificial Intelligence

  1. Dmitri Maslov
  2. Peter Rabl
  3. Rainer Blatt
  4. M. Kumph
  5. Robin Blume-Kohout
  6. Erik Nielsen
  7. Martin Rötteler
  8. Matthew Amy

In Atomic and Molecular Physics, and Optics

  1. Peter Rabl
  2. M. Kumph
  3. M. Brownnutt
  4. Robin Blume-Kohout
  5. Rainer Blatt
  6. Martin Rötteler
  7. Matthew Amy
  8. Michele Mosca

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