Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation

By D. Raghavan, X. Gu, Tinh Nguyen, M. Vanlandingham, A. Karim. 2000

208 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/98946bcb85274abada8d42732607c4dc0e5c6bc3

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. S. Nahar
2. M. Mohajeri
3. Athanasios Scarpas
4. M. V. D. Ven
5. Georg Schitter
6. A. Schmets

Citations in the corpus

• First Observation of Blending-Zone Morphology at Interface of Reclaimed Asphalt Binder and Virgin Bitumen (2013, background): “Atomic force microscopy (AFM) is a scanning probe technique that allows to reveal surface topography and heterogeneity of materials with high spatial resolution (24,25,26,27).”