Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field
By L. Mancini, N. Amirifar, D. Shinde, I. Blum, M. Gilbert, A. Vella, F. Vurpillot, Williams Lefebvre, R. Lardé, E. Talbot and 10 more. 2014
160 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Materials Chemistry, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/984269368372ad64ce246d86211f0267c98fd860
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Biomedical Engineering
In Materials Chemistry
In Mechanics of Materials
Citations in the corpus
- Behavior of molecules and molecular ions near a field emitter (2015, methodology): “l measurements reported by i.e. Mancini et al.. The results presented herein indicate that detecting N 2 2+ in the analysis of GaN is extremely unlikely, conversely to what has sometimes been reported[57]. This means that a discrepancy in composition measurements cannot be attributed to N 2 2+ poten”