Experimental evidence for epitaxial silicene on diboride thin films.
By A. Fleurence, R. Friedlein, T. Ozaki, H. Kawai, Ying Wang, Y. Yamada-Takamura. Physical Review Letters, 2012
1,340 citations recorded by the source corpus.
As the Si counterpart of graphene, silicene may be defined as an at least partially sp2-hybridized, atom-thick honeycomb layer of Si that possesses π-electronic bands. Here we show that two-dimensional, epitaxial silicene forms through surface segregation on zirconium diboride thin films grown on Si wafers. A particular buckling of silicene induced by the epitaxial relationship with the diboride surface leads to a direct π-electronic band gap at the Γ point. These results demonstrate that the buckling and thus the electronic properties of silicene are modified by epitaxial strain.
Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/9745df1c845b419849648977c775d8895a65e9af
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In Atomic and Molecular Physics, and Optics
In Materials Chemistry
Citations in the corpus
- Colloquium : Topological band theory (2016, background): “2013) Although silicene has been grown on various substrates, the resulting electronic and geometric structures may be quite different from those of freestanding silicene films.(Vogt et al. 2012; Feng, Ding, et al. 2012; Fleurence et al. 2012; Meng et al. 2013) Honeycomb III-V thin films are a natur”
- Colloquium : Spintronics in graphene and other two-dimensional materials (2019, background): “Silicene (A. Fleurence et al., 2012; Vogt et al., 2012), a single layer of silicon atoms forming a sp3-like honeycomb lattice, has attracted much attention due to its resemblance with graphene.”