Experimental evidence for epitaxial silicene on diboride thin films.

By A. Fleurence, R. Friedlein, T. Ozaki, H. Kawai, Ying Wang, Y. Yamada-Takamura. Physical Review Letters, 2012

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As the Si counterpart of graphene, silicene may be defined as an at least partially sp2-hybridized, atom-thick honeycomb layer of Si that possesses π-electronic bands. Here we show that two-dimensional, epitaxial silicene forms through surface segregation on zirconium diboride thin films grown on Si wafers. A particular buckling of silicene induced by the epitaxial relationship with the diboride surface leads to a direct π-electronic band gap at the Γ point. These results demonstrate that the buckling and thus the electronic properties of silicene are modified by epitaxial strain.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/9745df1c845b419849648977c775d8895a65e9af

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In Atomic and Molecular Physics, and Optics

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In Materials Chemistry

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