Amplitude or frequency modulation-detection in Kelvin probe force microscopy

By T. Glatzel, S. Sadewasser, M. Lux‐Steiner. 2003

209 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/96ec8966757d168f5f918f529ada9ec15aca4702