Thermal stability of AlCoCrCuFeNi high entropy alloy thin films studied by in-situ XRD analysis
By V. Dolique, A. Thomann, Pascal Brault, Y. Tessier, P. Gillon. 2010
172 citations recorded by the source corpus.
Subfields: Aerospace Engineering, Electrical and Electronic Engineering, Mechanical Engineering
View Paper: https://www.semanticscholar.org/paper/967d6cb03c3872c8b195624e44eda065fdd86503
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Aerospace Engineering
- Ming-Hung Tsai
- Jien‐Wei Yeh
- Oleg N. Senkov
- Daniel B. Miracle
- N. Jones
- E. Pickering
- P. K. Liaw
- Yong Zhang
In Mechanical Engineering
- Ming-Hung Tsai
- Jien‐Wei Yeh
- Oleg N. Senkov
- Daniel B. Miracle
- N. Jones
- E. Pickering
- P. K. Liaw
- Yong Zhang
Citations in the corpus
- High-Entropy Alloys: A Critical Review (2014, background): “[22,23,73,133–140] In terms of the phase and crystal structure of HEAs, most of our knowledge is based on the as-cast state (after vacuum arc melting).”
- Microstructures and properties of high-entropy alloy films and coatings: a review (2018, unknown): “[72] studied the thermal stability of AlCoCrCuFeNi HEA thin films by the in-situ XRD analysis at temperatures in the range 110–810°C.”