Thickness and Permittivity Measurement in Multi-Layered Dielectric Structures Using Complementary Split-Ring Resonators

By Chieh-Sen Lee, Chin-Lung Yang. IEEE Sensors Journal, 2014

159 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/961d421730a67840d22cf0556b737bdec1bb8531

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In Biomedical Engineering

1. Chin-Lung Yang
2. Chieh-Sen Lee

In Electrical and Electronic Engineering

1. Chin-Lung Yang
2. Chieh-Sen Lee

Citations in the corpus

• Complementary Split-Ring Resonators for Measuring Dielectric Constants and Loss Tangents (2014, methodology): “The ability of CSRR is extended to detect the permittivity and thickness variation of a multi-layered dielectric structure in [8], and mutual interactions of multi-layer effects on CSRR sensing are discussed.”