Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

By C. Yim, M. O'Brien, Niall McEvoy, S. Winters, I. Mirza, J. Lunney, Georg S. Duesberg. 2014

279 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/93bc1589d8a7693d4efb883b8cba500c28221183