Analytical modeling and experimental evaluation of interconnect parasitic inductance on MOSFET switching characteristics
By Y. Xiao, H. Shah, T. P. Chow, R. Gutmann. Nineteenth Annual IEEE Applied Power Electronics Conference and Exposition, 2004. APEC '04., 2004
168 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/903c1dabfdc30063a3aa750cf139c271e325b410
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
Citations in the corpus
- A Multiloop Method for Minimization of Parasitic Inductance in GaN-Based High-Frequency DC–DC Converter (2017, background): “Small parasitic inductance in power circuit can cause large voltage spike and ringing, which may result in the increase of switching losses, electromagnetic interference (EMI) issues, or even device breakdown [12]–[17].”