In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications

By X. Fontané, L. Calvo‐Barrio, V. Izquierdo‐Roca, E. Saucedo, A. Pérez‐Rodríguez, J. Morante, D. Berg, P. Dale, S. Siebentritt. 2011

322 citations recorded by the source corpus.

This work reports the in-depth resolved Raman scattering analysis with different excitation wavelengths of Cu2ZnSnS4 layers. Secondary phases constitute a central problem in this material, particularly since they cannot be distinguished by x-ray diffraction. Raman spectra measured with 325 nm excitation light after sputtering the layers to different depths show peaks that are not detectable by excitation in the visible. These are identified with Cu3SnS4 modes at the surface region while spectra measured close to the back region show peaks from ZnS and MoS2. Observation of ZnS is enhanced by resonant excitation conditions achieved when working with UV excitation.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/8f893534f0f1690237748394353978b0c3e0302a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

  1. A. Pérez‐Rodríguez
  2. V. Izquierdo‐Roca
  3. C. Platzer‐Björkman
  4. T. Kubart
  5. X. Fontané
  6. J. Scragg

In Materials Chemistry

  1. A. Pérez‐Rodríguez
  2. V. Izquierdo‐Roca
  3. C. Platzer‐Björkman
  4. T. Kubart
  5. X. Fontané
  6. J. Scragg

Citations in the corpus