Kelvin probe force microscopy of semiconductor surface defects

By Y. Rosenwaks, R. Shikler, T. Glatzel, S. Sadewasser. 2004

174 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/8f49c9e35ac8c247af418a856ff37bf6b9e839bc