Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics

By Sangwon Lee, Sungwook Park, Sungchul Kim, Y. Jeon, K. Jeon, Jun‐Hyun Park, Jae-Chul Park, I. Song, C. J. Kim, Young-soo Park and 2 more. IEEE Electron Device Letters, 2010

155 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/8deb7828b60f673fa57b7115b67966b7ce53fc7d