Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

By P. Paulson, R. Birkmire, W. Shafarman. 2003

243 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/88981b4adac640a1c02bb5272be1442f09fdaef1

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In Electrical and Electronic Engineering

  1. J. Sites
  2. M. Gloeckler

In Materials Chemistry

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  2. M. Gloeckler

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