Improved split C-V method for effective mobility extraction in sub-0.1-/spl mu/m Si MOSFETs

By K. Romanjek, F. Andrieu, T. Ernst, G. Ghibaudo. IEEE Electron Device Letters, 2004

151 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/8783839d6b5ddfe3f9d6dada8f179361f21409c0