Development of AFM-based techniques to measure mechanical properties of nanoscale structures

By S. Sundararajan, Bharat Bhushan. 2002

202 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/8758e183d5461954ffd124b5aecf43c41a0bd63f