Comparative studies on the stability of polymer versus SiO2 gate dielectrics for pentacene thin-film transistors

By D. Hwang, Kimoon Lee, J. Kim, S. Im, Ji Hoon Park, Eugene Kim. 2006

140 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/87109c702c8ccc9de4f23d9a857a8d74f406af43