Maximizing information obtained from secondary ion mass spectra of organic thin films using multivariate analysis

By M. Wagner, D. Graham, B. Ratner, D. Castner. 2004

140 citations recorded by the source corpus.

Subfields: Analytical Chemistry, Computational Mechanics, Spectroscopy

View Paper: https://www.semanticscholar.org/paper/86dca99b72f25ca2f1d4c8e9bcd9900d08047b1a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Analytical Chemistry

1. Ron M. A. Heeren
2. Liam A. McDonnell

In Computational Mechanics

1. Ron M. A. Heeren
2. Liam A. McDonnell

In Spectroscopy

1. Ron M. A. Heeren
2. Liam A. McDonnell

Citations in the corpus

• Imaging mass spectrometry. (2007, methodology): “…analysis (MVA) is extensively used to distinguish between groups (Wagner, Tyler, & Castner, 2002; Henry, Dupont-Gillain, & Bertrand, 2003; Wagner et al., 2004); from an imaging perspective, these correlations relate to spatial variation (Tyler, 2001, 2006; Biesinger et al., 2002;…”