Computed tomography for dimensional metrology

By Jean-Pierre Kruth, M. Bartscher, Simone Carmignato, R. Schmitt, L. Chiffre, A. Weckenmann. 2011

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Industrial X-Ray Computed Tomography (2018, methodology): “This modification allows the construction of CT 16 A. Thompson and R. Leach systems with higher accuracy and stability, features that are crucial to the applications for which they are produced (Kruth et al. 2011).”
Effects of defects on mechanical properties in metal additive manufacturing: A review focusing on X-ray tomography insights (2020, methodology): “scans, especiallywith regard to the resolution limit aswas shown in various studies [26,28,29,48,57,58].”
Surface texture metrology for metal additive manufacturing: a review (2016, background): “The main hurdles to widespread adoption of XCT as a means of measuring surfaces of AM parts reside in currently poor spatial resolutions of the measurement, and lack of complete understanding of metrological performance and error sources, necessary for a proper calibration of the surface extraction ”
XCT analysis of the influence of melt strategies on defect population in Ti?6Al?4V components manufactured by Selective Electron Beam Melting (2015, background): “The resolution is more difficult to define, but is the smallest perceptible feature using the reconstructed 3D voxel data [27].”