Scientific Charge-Coupled Devices

By J. Janesick, T. Elliott, S. Collins, M. Blouke, J. Freeman. 2001

1,400 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/8405273a8df590158f4dfafcfe3ebee74ea37967

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In Aerospace Engineering

In Electrical and Electronic Engineering

Citations in the corpus

Progress in focal plane array technologies (2012, methodology): “The fundamental performance parameters common to both CCD and CMOS imagers have been compared by Janesick [88,89].”
Origins of weak lensing systematics, and requirements on future instrumentation (or knowledge of instrumentation) (2012, background): “This can include global detector nonlinearity, in which the number of counts in each pixel is a nonlinear function of the incident flux, or nonlocal effects such as Charge Transfer Inefficiency in CCDs (Janesick 2001) and inter-pixel capacitance or persistence in HgCdTe devices (Barron et al. 2007; ”
Search for low-mass WIMPs in a 0.6 kg day exposure of the DAMIC experiment at SNOLAB (2016, background): “The inefficiency of charge transfer from pixel to pixel [8] is as low as 10−6 [6], and the readout noise for the charge collected in a pixel is ∼2 e− (Sec.”
Digital camera identification from sensor pattern noise (2006, background): “While it is commonly done for astronomical imaging,2consumer digital cameras do not flat field their images because it is difficult to achieve uniform sensor illumination inside the camera.”
Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon (2003, background): “ature data is taken from Reference [1].”
Source Camera Identification Using Enhanced Sensor Pattern Noise (2009, background): “The deterministic component of SPN is mainly caused by imperfections during the sensor manufacturing process and different sensitivity of pixels to light due to the inhomogeneity of silicon wafers [23], [24].”
Determining Image Origin and Integrity Using Sensor Noise (2008, background): “Both tasks can be formulated as binary hypothesis testing and are achieved by detecting the presence of PRNU (see Table III).”
High resolution X-ray detector for synchrotron-based microtomography (2002, neutral): “[15], the system gain (e /DN), the noise floor (e ) as well as the dynamic range (bits) of the CCD have been calculated.”