Real-Time Temperature Estimation for Power MOSFETs Considering Thermal Aging Effects

By Huifeng Chen, B. Ji, V. Pickert, Wenping Cao. IEEE transactions on device and materials reliability, 2014

177 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/82af2043a53ea030920b7fd93e16935b6a0f7a6e

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. U. Choi
2. Frede Blaabjerg
3. Søren Jørgensen
4. Xiongfei Wang
5. Huai Wang
6. Marco Liserre
7. Friedrich Wilhelm Fuchs
8. Yun Wei Li

Citations in the corpus

• Power Cycling Test Methods for Reliability Assessment of Power Device Modules in Respect to Temperature Stress (2018, methodology): “In [84], the VTH measurement circuit for junction temperature estimation of MOSFETs is proposed.”