Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation

By Wei Huang, Ronald G. Askin. 2003

147 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Statistics and Probability

View Paper: https://www.semanticscholar.org/paper/7f52fc3f1715e37c660ffe1064ba019a1bc0fe3e