Nondestructive defect identification with terahertz time-of-flight tomography

By Hua Zhong, Jingzhou Xu, Xu Xie, T. Yuan, R. Reightler, E. Madaras, Xi-Cheng Zhang. IEEE Sensors Journal, 2005

154 citations recorded by the source corpus.

Subfields: Astronomy and Astrophysics, Electrical and Electronic Engineering, Spectroscopy

View Paper: https://www.semanticscholar.org/paper/7cc7fbc8f5ce2df57a467541899637e45160b542

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Astronomy and Astrophysics

  1. Daniel M. Mittleman
  2. Wai Lam Chan
  3. Jason A. Deibel
  4. Xicheng Zhang
  5. Sushil Kumar
  6. Tadao Nagatsuma

In Electrical and Electronic Engineering

  1. Daniel M. Mittleman
  2. Wai Lam Chan
  3. Jason A. Deibel
  4. Xicheng Zhang
  5. Sushil Kumar
  6. A. Markelz
  7. Tadao Nagatsuma
  8. Shuncong Zhong

In Spectroscopy

  1. Daniel M. Mittleman
  2. Xicheng Zhang
  3. Wai Lam Chan
  4. Jason A. Deibel

Citations in the corpus