Nondestructive defect identification with terahertz time-of-flight tomography
By Hua Zhong, Jingzhou Xu, Xu Xie, T. Yuan, R. Reightler, E. Madaras, Xi-Cheng Zhang. IEEE Sensors Journal, 2005
154 citations recorded by the source corpus.
Subfields: Astronomy and Astrophysics, Electrical and Electronic Engineering, Spectroscopy
View Paper: https://www.semanticscholar.org/paper/7cc7fbc8f5ce2df57a467541899637e45160b542
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In Astronomy and Astrophysics
In Electrical and Electronic Engineering
- Daniel M. Mittleman
- Wai Lam Chan
- Jason A. Deibel
- Xicheng Zhang
- Sushil Kumar
- A. Markelz
- Tadao Nagatsuma
- Shuncong Zhong
In Spectroscopy
Citations in the corpus
- Review of Terahertz Tomography Techniques (2014, background): “The main application fields of reflection imaging concern materials where transmission measurement is prohibited and opaque materials (biological media due to the high liquid water content) which cannot be imaged in transmission mode [20].”
- In Introductory Review to THz Non-Destructive Testing of Composite Mater (2013, background): “It is worth noting that apart from 3D computed reconstruction algorithms, in-depth 3D information of composite materials has also been widely inferred using THz TDS setups in reflection configuration and based on THz Time-of-Flight strategies [20, 97, 98].”
- Imaging with terahertz radiation (2007, methodology): “These can be located using either a time-domain system [159] or using a narrow-band cw source [146].”
- Terahertz Spectroscopy and Imaging for Defense and Security Applications (2007, methodology): “This raster scan configuration has been widely adopted in applications such as biomedical diagnosis [62], the imaging and sensing of drugs [63], explosives and landmines [64], and nondestructive defect identifications [65], [66].”