Graphene thickness determination using reflection and contrast spectroscopy.

By Zhenhua Ni, H. Wang, J. Kasim, H. Fan, Ting Yu, Yihong Wu, Y. Feng, Zexiang Shen. Nano letters (Print), 2007

1,159 citations recorded by the source corpus.

Subfields: Computational Mechanics, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/7c101808a15b74342d50e09b10e5ed402b5f7566

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computational Mechanics

1. T. Yu
2. Zhenhua Ni
3. Yingying Wang
4. Rodney S. Ruoff
5. Zexiang Shen

In Materials Chemistry

1. A. Castellanos-Gómez
2. Zhenhua Ni
3. T. Yu
4. Zexiang Shen
5. G. Steele
6. Herre S. J. van der Zant
7. Rodney S. Ruoff
8. Junhong Chen

Citations in the corpus

• Raman Spectroscopic Characterization of Graphene (2010, background): “According to Fresnel’s equations (125, 126), the intensity of the signal depends on the electronic field distribution; in other words, the resulting interference between all transmitted optical paths in graphene films (124).”