Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques

By N. Hellgren, Jinghua Guo, Yi Luo, C. Såthe, A. Agui, S. Kashtanov, J. Nordgren, Hans Ågren, J. Sundgren. 2005

151 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/7b8dc720b7de94d70574b3fbac669d675725c531