Surface characterization and microstructure of ITO thin films at different annealing temperatures

By D. Raoufi, A. Kiasatpour, H. Fallah, A. S. Rozatian. 2007

221 citations recorded by the source corpus.

Subfields: Computational Mechanics, Industrial and Manufacturing Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/7a4e03434408e09e9240ae0703d900c14a32f403

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. Manvendra Kumar
2. S. Dwivedi
3. A. C. Pandey
4. R. P. Yadav
5. A. K. Mittal

Citations in the corpus

• Fractal and multifractal analysis of LiF thin film surface (2012, background): “A larger value of α corresponds to a locally smooth surface, whereas, a smaller one corresponds to more locally rough (jagged) morphology [26, 27].”