Introduction to Focused Ion Beams

By L. Giannuzzi, F. Stevie. 2005

574 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Computational Mechanics, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/7943c03b16b125bb2e2c7d88c2f552ef3dd25aea

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Citations in the corpus

• Minimizing damage during FIB sample preparation of soft materials (2012, background): “Focused ion beam (FIB) microscopy has many advantages over traditional transmission electron microscopy (TEM) sample preparation techniques, primarily the ability to target specific areas for characterization (Giannuzzi & Stevie, 2005).”
• Nanoscale organo-mineral reactions of biochars in ferrosol: an investigation using microscopy (2012, background): “In addition, the thickness of the TEM foil can also be monitored by the electron beam (Giannuzzi and Stevie 2005).”