Measuring the Modulus of Soft Polymer Networks via a Buckling-Based Metrology

By E. A. Wilder, Shu Guo, S. Lin‐Gibson, M. Fasolka, C. Stafford. 2006

192 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Cell Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/790ea230f671a12dc2803b43f9d3778ae24b8561

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In Atomic and Molecular Physics, and Optics

1. Yonggang Huang
2. John A. Rogers

Citations in the corpus

• Buckling of a stiff thin film on a compliant substrate in large deformation (2008, methodology): “=3 is defined as the critical buckling strain, or the minimum strain needed to induce buckling, which is 0.034% using the literature values for the mechanical properties (Ef = 130 GPa, vf = 0.27, 1 Es = 1.8 MPa, vs = 0.48) (Wilder et al., 2006; INSPEC, 1988).”
• Extended PDMS stiffness range for flexible systems (2015, unknown): “Much work has been done into the investigation of the mechanical properties of PDMS and their potential tunability [24, 26, 21, 27, 28, 16, 29, 30, 17, 31, 4, 32, 33, 34, 35].”