The Virtual Fields Method for Extracting Constitutive Parameters From Full‐Field Measurements: a Review
By Michel Grédiac, Fabrice Pierron, Stéphane Avril, Evelyne Toussaint. 2006
304 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/781ea9f5467dcc9700bf67ee17309d3e04095598
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Computer Vision and Pattern Recognition
In Electrical and Electronic Engineering
Citations in the corpus
- Similarity measures for identifying material parameters from hysteresis loops using inverse analysis (2018, methodology): “Alternatively full-field displacement methods provided by non-invasive optical techniques have been used with the virtual fields methods to identify constitutive parameters [2, 3].”
- Identification of plastic constitutive parameters at large deformations from three dimensional displacement fields (2011, unknown): “[34] and its application to elastoplasticity is described in Grédiac and Pierron [35] and Avril et al.”