Improved precision in strain measurement using nanobeam electron diffraction

By A. Béché, J. Rouviere, L. Clément, J. Hartmann. 2009

162 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Structural Biology

View Paper: https://www.semanticscholar.org/paper/777584c3850d21ff1155e14a54fd8f821e04653c