Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

By Robert W. Stark, W. Heckl. 2000

158 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/776d527f795e9a8ca78874c600427ade65c6f5f2