Measurement technique for characterizing memory effects in RF power amplifiers

By J. Vuolevi, T. Rahkonen, J. Manninen. RAWCON 2000. 2000 IEEE Radio and Wireless Conference (Cat. No.00EX404), 2000

453 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/76353c8fc226326916e8b64f98ea8ec67c8b0363

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In Electrical and Electronic Engineering

  1. Fadhel M. Ghannouchi
  2. Oualid Hammi
  3. Slim Boumaiza
  4. Taijun Liu
  5. José Carlos Pedro
  6. G. Zhou
  7. J. Kenney
  8. Hyunchul Ku

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