Targeting Ultimate Accuracy: Face Recognition via Deep Embedding

By Jingtuo Liu, Yafeng Deng, Tao Bai, Chang Huang. 2015

245 citations recorded by the source corpus.

Face Recognition has been studied for many decades. As opposed to traditional hand-crafted features such as LBP and HOG, much more sophisticated features can be learned automatically by deep learning methods in a data-driven way. In this paper, we propose a two-stage approach that combines a multi-patch deep CNN and deep metric learning, which extracts low dimensional but very discriminative features for face verification and recognition. Experiments show that this method outperforms other state-of-the-art methods on LFW dataset, achieving 99.77% pair-wise verification accuracy and significantly better accuracy under other two more practical protocols. This paper also discusses the importance of data size and the number of patches, showing a clear path to practical high-performance face recognition systems in real world.

Subfields: Computer Vision and Pattern Recognition, Signal Processing

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Dacheng Tao
  2. Luc Van Gool
  3. Yu Qiao
  4. Xiaogang Wang
  5. Chen Change Loy
  6. Yi Yang
  7. Andrew Zisserman
  8. Ming-Hsuan Yang

In Signal Processing

  1. Weihong Deng
  2. Mei Wang
  3. Stefanos P. Zafeiriou
  4. Ramalingam Chellappa
  5. Yu Qiao
  6. Jiankang Deng
  7. Weiyang Liu
  8. Yandong Wen

Citations in the corpus