Violation of Fourier's Law and Anomalous Heat Diffusion in Silicon
By Nuo Yang, Gang Zhang, Baowen Li. 2010
237 citations recorded by the source corpus.
We study heat conduction and diffusion in silicon nanowires (SiNWs) systematically by using non-equilibrium molecular dynamics. It is found that the thermal conductivity of SiNWs diverges with the length, even when the length is up to 1,100 nm which is much longer than the phonon mean free path. Moreover, an anomalous heat diffusion is observed which is believed to be responsible for the length dependent thermal conductivity. Our results provide strong evidence that Fourier's law of heat conduction is not valid in low dimensional nanostructures.
Subfields: Civil and Structural Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/7588fd13f17565e866cf59063d89d7c8b86a9ba0
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In Civil and Structural Engineering
In Materials Chemistry
Citations in the corpus
- Colloquium: Phononic thermal properties of two-dimensional materials (2017, background): “However, anomalous thermal conduction behavior has also been observed in numerical simulations for carbon nanotubes (Maruyama, 2002; Zhang and Li, 2005), nanowires (Yang, Zhang, and Li, 2010), and polymer chains (Henry and Chen, 2008, 2009; Liu and Yang, 2012).”
- Colloquium : Phononics: Manipulating heat flow with electronic analogs and beyond (2011, background): “In fact, both numerical and experimental studies in nanostructures ranging from nanotubes (Chang et al., 2008; Zhang and Li, 2005), nanowires (Yang et al., 2010), to polyethylene nanofibers (Henry and Chen, 2008, 2009; Shen et al., 2010) all show that phonons undergo anomalous diffusion - i.e. so…”
- Thermal conduction phenomena in carbon nanotubes and related nanostructured materials (2013, background): “By scaling the conductance value from direct measurement of Yang, Zhang, and Li (2010) by the relative contact areas ½ð1:4 nmÞ2=ð74 nm 121 nmÞ , the estimated contact conductance for 1.4 nm nanotubes is 21 pW=K, slightly larger than that extracted from film measurement.”