Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum
By T. Gengenbach, George H. Major, M. Linford, C. Easton. Journal of Vacuum Science and Technology, 2021
492 citations recorded by the source corpus.
The carbon 1s photoelectron spectrum is the most widely fit and analyzed narrow scan in the x-ray photoelectron spectroscopy (XPS) literature. It is, therefore, critically important to adopt well-established protocols based on best practices for its analysis, since results of these efforts affect research outcomes in a wide range of different application areas across materials science. Unfortunately, much XPS peak fitting in the scientific literature is inaccurate. In this guide, we describe and explain the most common problems associated with C 1s narrow scan analysis in the XPS literature. We then provide an overview of rules, principles, and considerations that, taken together, should guide the approach to the analysis of C 1s spectra. We propose that following this approach should result in (1) the avoidance of common problems and (2) the extraction of reliable, reproducible, and meaningful information from experimental data.
Subfields: Materials Chemistry, Radiation, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/74d690cc414f42cf61510298265b1ef8c45c7613
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In Materials Chemistry
In Radiation
In Surfaces, Coatings and Films
Citations in the corpus
- Comments on the XPS Analysis of Carbon Materials (2021, methodology): “[11] reported a method for fitting the C (1s) envelope of graphitic carbon materials, using a reference spectrum of clean graphite/HOPG as a model for the graphitic backbone.”