Optimal step-stress testing for progressively Type-I censored data from exponential distribution
By Narayanaswamy Balakrishnan, D. Han. 2009
96 citations recorded by the source corpus.
Subfields: Safety, Risk, Reliability and Quality, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/7484f15191cec8807921916737ec9227fc72f0e1
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In Safety, Risk, Reliability and Quality
In Statistics and Probability
- Narayanaswamy Balakrishnan
- David Han
- H. Ng
- George Iliopoulos
- D. Han
- Debasis Kundu
- Gauss Moutinho Cordeiro
- Biswabrata Pradhan
Citations in the corpus
- Exact inference for progressively Type-I censored exponential failure data (2011, background): “Chatterjee and Sen (1973) and Majumdar and Sen (1978) discussed nonparametric tests under Type-I PC, while Sinha and Sen (1982) considered clinical trials with staggered entry times and random withdrawals under the model of Type-I PC. Recently, Gouno et al. (2004), Han et al. (2006), and Balakrishn”
- A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests (2009, methodology): “Then, under such a modified progressive censoring scheme, Balakrishnan and Han (2008a) derived the maximum likelihood estimators of the parameters α and β as well as an explicit expression for the Fisher information matrix.”
- Comparison between constant‐stress and step‐stress accelerated life tests under Time Constraint (2013, methodology): “Correspondence to: D. Han (david.han@utsa.edu) The optimal ALT design has attracted great attention in the reliability literature.”