3-Omega Measurements of Vertically Oriented Carbon Nanotubes on Silicon
By X. Hu, A. Padilla, Jun Xu, Timothy S. Fisher, Kenneth E. Goodson. 2006
242 citations recorded by the source corpus.
Subfields: Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/73fe376ac1739c1a1ad824d3730d4ff1037a1437
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In Materials Chemistry
Citations in the corpus
- Thermal conduction phenomena in carbon nanotubes and related nanostructured materials (2013, methodology): “Typically thin films of titanium, aluminum, and nickel are deposited on silicon substrates for optimal CNT growth using chemical vapor deposition with methane as a carbon source (K. Zhang et al., 2005; Hu et al., 2006; Xu and Fisher, Rev. Mod.”
- Contact mechanics and thermal conductance of carbon nanotube array interfaces (2009, methodology): “For example, with an effective thermal conductivity of approximately 80 W/mK [15] and an array thickness of 5 lm after compression, R00array would be approximately 6.3 10 2 mm2 K/W, whereas the overall resistance is of order 1 mm2 K/W or larger.”